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This procedure is used early in the semester as part of the IC-CAP
Tutorial
to:
- Familiarize students with the operation of the evaporator,
- Provide a device for probing practice, and
- Provide a device to measure and model with ICCAP.
Procedure
- Starting Material: Almost any lightly doped N-type silicon
will do.
- Optional: Degrease the wafer.
- Etch the
wafer for 15-20 seconds in the "hot oxide etch" under
the acid hood. (It is called "hot" because it is more
concentrated than a standard oxide etch.)
- Thoroughly dry the wafer. The bakeout hotplate may be used
for up to 30 seconds. This step is important to improve pumping
speed, but the hotplate may actually cause excessive native oxide
to grow.
- Use the Evaporator Instructions to
manually deposit about 1500 angstroms of aluminum onto
the shiny side of the wafer through an evaporation mask.
- Use the manual pumpdown procedure.
- Use 2 aluminum wires.
- Use the etching instructions
to etch back the aluminum for 10-15 seconds in aluminum etch.
- Anneal
your wafer in the annealing furnace for 10 minutes at 475C. This
will improve the quality of the Silicon-Aluminum interface by
raising the temperature to near the eutectic point. Some intermixing
will occur and any interface problems such as voids, oxides, vacuum
pump oil residues, etc. will be reduced.
In the paper version of the manual, the annealing furnace instructions
are at the end of appendix F.
- That's it! You have made a nonlinear electronic device called
a Schottky diode!
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- U of Illinois ECE Dept. - beernink@uiuc.edu
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Processes/Schottky.html updated 16-May-96