Warning! This is the archived 1999 Fabweb site! Here is the latest site
diodes_344 help
Yes this is the right figure! We test the emitter/base and collector/base diodes of the
BJTs.
The probing for the diode testing is the same as for the BJT testing, so it is most efficient to
test the diodes and the BJTs together. Also, if your BJT is not working, it can be useful to make
sure that the individual diodes in the BJT are working.
The ICCAP Instructions
contain the basic procedures for making measurements
and performing modeling.
This screen is intended to point out things unique
to using the diodes_344.mdl model file.
Device Selection
You should measure the diodes on one of the square emitter BJTs. The third BJT from the left on
the bottom row is recommended. Normally, you will be required to measure 3 sets of diodes from
different device cells.
Make copies with the same naming scheme (diodes_1, diodes_2, and
diodes_3) as you test your devices.
Probe Assignments
- SMU1/probe1/CM(H)---->Base
- SMU2/probe2---->Collector
- SMU3/probe3---->Emitter
- SMU4/probe4 is not used.
Note: CM(L) will have to be moved between the Collector(probe2) and Emitter(probe3)
as needed to complete the measurements.
Related Models
- npn_344
- This model tests the BJTs.
This screen was created by
Kevin Beernink - U of Illinois ECE Dept. - kevinb@uiuc.edu
E-mail comments and suggestions to ece344@uiuc.edu or use the
FEEDBACK FORM.
Software/ICCAP/npn_344.help.html
Warning! This is the archived 1999 Fabweb site! Here is the latest site