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ECE344: Theory and Fabrication of Integrated Circuits
Note: The lectures are not taken directly from Anner's book. The
references indicate where the same or similar topic is covered in Anner:
Planar Processing Primer.
Syllabus
- Introduction
- Class Organizaiton
- Graduate Study
- Processing Overview........................(Anner Chp. 1)
- The Silicon Wafer..........................(Anner Chp. 2)
- Wafer Manufacture...........(take a look at
Mitsubishi Materials.)
- Characterization...........................(Anner 3.1, 3.2, 3.4-3.9)
- Oxidation...................................(Anner 5.4-5.7, 5.10)
- Fick's Laws Derivation
- Oxidation Chemistry
- Grove's Model
- Photolithography
- Photochemistry of Resists
- Photoimaging
- Etching Processes
- Wet Chemical Etching
- Plasma Etching
- Photoresist Removal
- Junction Diffusion
- Chemistry of Phases and Solid Solubility
- Diffusion from a Constant Source
- Junction Formation
- Drive Diffusion and Time Dependent Diffusion
- Bipolar Transistor Process Design
- Diffusion Related Processes
- Outdiffusion
- Effective Masking
- Dopant Sources and Process Control
- Sheet Resistance of Diffused Layers
- Metallization
- Metal Semiconductor Band Diagram
- Vacuum Metallization Systems
- Chemical Vapor Deposition
- Vapor Phase Chemistry and Reactors
- Epitaxy
- Deposited Insulators
- Ion Beam Processing
- Ion Optics
- Ion Implantation
- Implanted Profiles, Junctions, and Masking
- Ion Beam Etching and Milling
- pn Junction Electronics
- Capacitance Profiling
- Junction Breakdown
- Device and Integrated Circuit Processing
- MOS Capacitor
- MOS Transistors
- Bipolar Devices
- Testing and Packaging
- Yield and the Manufacturing Environment
This screen is maintained by
Kevin Beernink - U of
Illinois ECE Dept. - beernink@uiuc.edu
E-mail comments and suggestions to
ece344@uiuc.edu, or use the
FEEDBACK FORM.
Lecture/syllabus.html updated June 7, 1996