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ECE444: Theory and Fabrication of Integrated Circuits
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pn Junction Diodes

The probing for the diode testing is the same as for the BJT testing, so it is most efficient to test the diodes and the BJTs together. Also, if your BJT is not working, it can be useful to make sure that the individual diodes in the BJT are working.

The ICS Instructions contain the basic procedures for making measurements. This screen is intended to point out things unique to using the DIODE model file.

Device Selection

You should measure the diodes on one of the square emitter BJTs. The third BJT from the left on the bottom row is recommended. Normally, you will be required to measure 3 sets of diodes from different device cells. Make copies with the same naming scheme (diodes_1, diodes_2, and diodes_3) as you test your devices.

Probe Assignments

  • SMU1/probe1/CM(H)---->Base
  • SMU2/probe2---->Collector
  • SMU3/probe3---->Emitter
  • SMU4/probe4 is not used.
Note: CM(L) will have to be moved between the Collector(probe2) and Emitter(probe3) as needed to complete the measurements.