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ece444:
Theory and Fabrication of Integrated Circuits
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Testing:


Perform the following tests in order -

  1. MOSCapacitor
  2. PMOSFET
  3. Diode
  4. BJT

ICS reference -

ICS Measurements

There are two types of windows for the tests – data windows and graph windows. You can tell the two apart by their icons:

  • Data:
  • Graph:

Open the IC_V_VCE data window by double-clicking the title bar or single clicking the Restore or Maximize buttons. You will see an empty spreadsheet.

  • Once a device is tested the returned data is stored here (temporarily unless saved).

Open the IC_V_VCE graph window.

  • You will see a black screen with ICS|||| in the middle. Since nothing has been tested, there is no data to display.

In order to populate the test setup, the test must be run. Click on the Measure icon at the top of the main window.

This will open the Measure window.

  • At the top is a drop down box with all of the available tests for the device. The active spreadsheet or plot window will determine the initial test selected.
  • To select another test setup, select it from the drop down box.
  • To initiate a test, press Single.
  • If you wish to stop the test for any reason, press Stop.

After pressing Single:

  • The commands for executing the test are sent to the instrument.
  • The instrument performs the test and sends the results back to ICS.
  • If there are any problems encountered, a message box will popup describing the problem (press OK to close the message).

The returned data is then placed in the spreadsheet and any data tied to a graph is then displayed.

 

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